Thin films of amorphous vanadium metal were deposited on a glass substrate using the electron beam evaporator, these thin films were then exposed to a focused 1064 nm wavelength nanosecond laser pulses. The laser fluence was selected such that it was below the ablation threshold of the films, x-ray diffraction measurement revealed the formation of an oxide phase of vanadium after the laser exposure. The time of flight-secondary ion mass spectrometry data analysis showed a uniform elemental distribution of the elements on the films, whereas the Rutherford backscattering spectrometry results showed that the concentration of oxygen as a function of the laser fluence was increasing, hinting to the incorporation of the oxygen atoms in the films as the laser fluence increases. UV-Vis-NIR percentage reflectance measurements showed small evolution in the visible part of the spectrum due to laser exposure.

Metal and Metal Oxide Transformation and Texturing Using Pulsed Fiber Laser

EATON, SHANE MICHAEL ADLER;DEMIR, ALI GOKHAN;PREVITALI, BARBARA;RAMPONI, ROBERTA;
2015-01-01

Abstract

Thin films of amorphous vanadium metal were deposited on a glass substrate using the electron beam evaporator, these thin films were then exposed to a focused 1064 nm wavelength nanosecond laser pulses. The laser fluence was selected such that it was below the ablation threshold of the films, x-ray diffraction measurement revealed the formation of an oxide phase of vanadium after the laser exposure. The time of flight-secondary ion mass spectrometry data analysis showed a uniform elemental distribution of the elements on the films, whereas the Rutherford backscattering spectrometry results showed that the concentration of oxygen as a function of the laser fluence was increasing, hinting to the incorporation of the oxygen atoms in the films as the laser fluence increases. UV-Vis-NIR percentage reflectance measurements showed small evolution in the visible part of the spectrum due to laser exposure.
2015
Proceedings of 7th International Symposium on Macro- and Supramolecular Architectures and Materials
Amorphous; High resolution SEM; Laser fluence; Oxidation; TOF-SIMS; UV-Vis-NIR reflectance; Vanadium oxide; Materials Science (all)
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11311/972952
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