This letter presents a high-fill-factor 60 x 1 linear array of single-photon avalanche diodes (SPADs) and 60 integrated time-to-digital converters (TDCs). The 100-mu m diameter SPAD has high photon detection efficiency (50% at 420 nm), very low dark count rate (2.5 kcps at room temperature), and negligible crosstalk (similar to 0.1% between adjacent pixels). The TDC resolution is 250 ps and its single-shot precision of 200-ps rms is limited just by the quantization noise. Very good linearity (DNL = 5% LSB rms and INL = 30% LSB rms) is achieved because of the sliding scale technique. The overall fill-factor of the array is 52%. This chip is suitable for many advanced spectroscopic applications, since it provides 60 independent single-photon detectors and the corresponding counting and timing electronics within just one integrated circuit.

High-fill-factor 60×1 SPAD array with 60 subnanosecond integrated TDCs

VILLA, FEDERICA ALBERTA;LUSSANA, RUDI;TAMBORINI, DAVIDE;TOSI, ALBERTO;ZAPPA, FRANCO
2015

Abstract

This letter presents a high-fill-factor 60 x 1 linear array of single-photon avalanche diodes (SPADs) and 60 integrated time-to-digital converters (TDCs). The 100-mu m diameter SPAD has high photon detection efficiency (50% at 420 nm), very low dark count rate (2.5 kcps at room temperature), and negligible crosstalk (similar to 0.1% between adjacent pixels). The TDC resolution is 250 ps and its single-shot precision of 200-ps rms is limited just by the quantization noise. Very good linearity (DNL = 5% LSB rms and INL = 30% LSB rms) is achieved because of the sliding scale technique. The overall fill-factor of the array is 52%. This chip is suitable for many advanced spectroscopic applications, since it provides 60 independent single-photon detectors and the corresponding counting and timing electronics within just one integrated circuit.
CMOS imagers; Single-Photon Avalanche-Diode (SPAD); Spectroscopy; Time-Correlated Single-Photon Counting (TCSPC); Time-of-Flight (TOF) measurements; Time-to-Digital Converter (TDC); Electrical and Electronic Engineering; Atomic and Molecular Physics, and Optics; Electronic, Optical and Magnetic Materials; sezele
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11311/971954
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