A high sensitivity in-band OSNR monitor system integrated on SOI platform is presented. The device exploits a narrow-band microring resonator to select the portion of the channel spectrum that is most sensitive to OSNR variations, and performs an autocorrelation measurement using a Mach-Zehnder interferometer. The proposed scheme allows in-line OSNR monitoring from 8 dB to 28 dB, with 0.2 dB accuracy.

In-band OSNR monitoring with a high sensitivity silicon photonics system-on-chip

ANNONI, ANDREA;MELLONI, ANDREA IVANO;MORICHETTI, FRANCESCO
2014

Abstract

A high sensitivity in-band OSNR monitor system integrated on SOI platform is presented. The device exploits a narrow-band microring resonator to select the portion of the channel spectrum that is most sensitive to OSNR variations, and performs an autocorrelation measurement using a Mach-Zehnder interferometer. The proposed scheme allows in-line OSNR monitoring from 8 dB to 28 dB, with 0.2 dB accuracy.
Proceed. of the 16th International Conference on Transparent Optical Networks 2014
9781479956005
delay-line interferometer; in-band optical signal-to-noise ratio (OSNR); integrated optics devices; optical performance monitoring; silicon photonics; TEL
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11311/965213
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