A CMOS imager that combines single photon sensitivity with photon timing capabilities has been developed for Time-Of-Flight (TOF) measurements and for Time-Correlated Single-Photon Counting (TCSPC) applications. A test structure with 32×4 pixels is presented in this paper. Each pixel is based on a 30 $\mu$m diameter Single-Photon Avalanche Diode (SPAD) with low Dark Counting Rate (60 cps at room temperature) and a Time-to-Digital Converter (TDC) with 400 ps resolution. Some preliminary measurements confirm the possibility to use this SPAD array in a 3D TOF scanning system.

CMOS single photon sensor with in-pixel TDC for Time-of-Flight applications

VILLA, FEDERICA ALBERTA;LUSSANA, RUDI;TAMBORINI, DAVIDE;BRONZI, DANILO;MARKOVIC, BOJAN;TOSI, ALBERTO;ZAPPA, FRANCO;TISA, SIMONE
2013

Abstract

A CMOS imager that combines single photon sensitivity with photon timing capabilities has been developed for Time-Of-Flight (TOF) measurements and for Time-Correlated Single-Photon Counting (TCSPC) applications. A test structure with 32×4 pixels is presented in this paper. Each pixel is based on a 30 $\mu$m diameter Single-Photon Avalanche Diode (SPAD) with low Dark Counting Rate (60 cps at room temperature) and a Time-to-Digital Converter (TDC) with 400 ps resolution. Some preliminary measurements confirm the possibility to use this SPAD array in a 3D TOF scanning system.
Time-to-Digital Converters (NoMe TDC), 2013 IEEE Nordic-Mediterranean Workshop on
978-147991184-4
Arrays; Histograms; Measurement by laser beam; Photonics; Single-Photon Avalanche Diode (SPAD); Temperature measurement; Three-dimensional displays; Time measurement; Time-Correlated Single-Photon Counting; Time-of-Flight (ToF); Time-to-Digital Converter (TDC); sezele
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11311/760701
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