Subpixel Edge Localization (EL) techniques are often affected by an error that exhibits a systematic character When this happens their performance can be improved through compensation of the systematic portion of the localization error In this paper we propose and analyze a method for estimating the EL characteristic of subpixel EL techniques through statistical analysis of appropriate test images The impact of the compensation method on the accuracy of a camera calibration procedure has been proven to be quite signicant, which can be crucial especially in applications of low-cost photogrammetry and 3D reconstruction from multiple views.
Subpixel Edge Localization with Statistical Error Compensation
SARTI, AUGUSTO;TUBARO, STEFANO
1996-01-01
Abstract
Subpixel Edge Localization (EL) techniques are often affected by an error that exhibits a systematic character When this happens their performance can be improved through compensation of the systematic portion of the localization error In this paper we propose and analyze a method for estimating the EL characteristic of subpixel EL techniques through statistical analysis of appropriate test images The impact of the compensation method on the accuracy of a camera calibration procedure has been proven to be quite signicant, which can be crucial especially in applications of low-cost photogrammetry and 3D reconstruction from multiple views.File | Dimensione | Formato | |
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1996_EURASIP_EUSIPCO_subpixel_edge_localization_error_compensation.pdf
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