Subpixel Edge Localization (EL) techniques are often affected by an error that exhibits a systematic character When this happens their performance can be improved through compensation of the systematic portion of the localization error In this paper we propose and analyze a method for estimating the EL characteristic of subpixel EL techniques through statistical analysis of appropriate test images The impact of the compensation method on the accuracy of a camera calibration procedure has been proven to be quite signicant, which can be crucial especially in applications of low-cost photogrammetry and 3D reconstruction from multiple views.

Subpixel Edge Localization with Statistical Error Compensation

SARTI, AUGUSTO;TUBARO, STEFANO
1996-01-01

Abstract

Subpixel Edge Localization (EL) techniques are often affected by an error that exhibits a systematic character When this happens their performance can be improved through compensation of the systematic portion of the localization error In this paper we propose and analyze a method for estimating the EL characteristic of subpixel EL techniques through statistical analysis of appropriate test images The impact of the compensation method on the accuracy of a camera calibration procedure has been proven to be quite signicant, which can be crucial especially in applications of low-cost photogrammetry and 3D reconstruction from multiple views.
1996
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11311/691238
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