A two-wavelength approach for high-resolution absolute interferometric measurement is presented where two sources are extracted from the same superluminescent emission by a couple of interference filters. The advantages in terms of resolution and precision of the novel method can be exploited in a wide class of either free-space or guided wave interferometers. An experiment of distance measurement is given and a resolution better than 1/1000 μm is reached with an accuracy of 104. This method is able to match a wide range of sensing specifications with unique characteristics of simplicity and reliability.
Two-wavelength interferometry by superluminescent source filtering
MARTINELLI, MARIO
1992-01-01
Abstract
A two-wavelength approach for high-resolution absolute interferometric measurement is presented where two sources are extracted from the same superluminescent emission by a couple of interference filters. The advantages in terms of resolution and precision of the novel method can be exploited in a wide class of either free-space or guided wave interferometers. An experiment of distance measurement is given and a resolution better than 1/1000 μm is reached with an accuracy of 104. This method is able to match a wide range of sensing specifications with unique characteristics of simplicity and reliability.File in questo prodotto:
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