This paper describes an original simulation-based method to derive the stochastic properties of the output noise of switched-capacitor circuits which are used in sampled-data converters. The method relies on a linear time-varying approximation of the large-signal transient response of the switched circuits. It is shown how switched-capacitor-circuit noise and quantization noise, due to the presence ofharsh comparators, can be analyzed in a unified frame where the data converter is modeled as a discrete-time system.
Stochastic Analysis of Switched-Capacitor Circuits for Sampled Data Converters
MAFFEZZONI, PAOLO
2012-01-01
Abstract
This paper describes an original simulation-based method to derive the stochastic properties of the output noise of switched-capacitor circuits which are used in sampled-data converters. The method relies on a linear time-varying approximation of the large-signal transient response of the switched circuits. It is shown how switched-capacitor-circuit noise and quantization noise, due to the presence ofharsh comparators, can be analyzed in a unified frame where the data converter is modeled as a discrete-time system.File in questo prodotto:
| File | Dimensione | Formato | |
|---|---|---|---|
|
TCAD2012_06152779.pdf
Accesso riservato
:
Post-Print (DRAFT o Author’s Accepted Manuscript-AAM)
Dimensione
2.12 MB
Formato
Adobe PDF
|
2.12 MB | Adobe PDF | Visualizza/Apri |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
