A practical approach for lumped-parameter circuit modeling of SMT ferrite beads is introduced. Vector Network Analyzer (VNA) measurements are utilized to provide the frequency-dependent characteristics for SPICE analysis. The measured data is imported into the simulation environment via Analog Behavioral Models (ABM) accounting for the frequency dependent behavior of the ferrite sheets. It demonstrates a significant departure from a simple R-L-C circuit network. Model accuracy is validated by realization of an ad hoc testboard and by experimental characterization of the component in terms of Insertion Loss.

Modeling SMT ferrite beads for SPICE simulation

GRASSI, FLAVIA;
2011-01-01

Abstract

A practical approach for lumped-parameter circuit modeling of SMT ferrite beads is introduced. Vector Network Analyzer (VNA) measurements are utilized to provide the frequency-dependent characteristics for SPICE analysis. The measured data is imported into the simulation environment via Analog Behavioral Models (ABM) accounting for the frequency dependent behavior of the ferrite sheets. It demonstrates a significant departure from a simple R-L-C circuit network. Model accuracy is validated by realization of an ad hoc testboard and by experimental characterization of the component in terms of Insertion Loss.
2011
Proc. 2011 IEEE International Symposium on Electromagnetic Compatibility
9781457708107
9781457708121
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11311/631591
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