We report on the chemical and electronic properties of epitaxial Fe/MgO/Ge(001) heterostructures probed by X-ray Photoemission Spectroscopy. At variance with the Fe/MgO/Fe system, annealing at 570 K produces a sizable interdiffusion at the upper Fe/MgO interface, while at 470 K this process is inhibited. The XPS analysis of band alignment in heterostructures annealed at 470 K grown onto an intrinsic Ge substrate indicates that the Fermi level is placed at the center of the MgO gap and that the Schottky barrier height is 0.35±0.1 eV, thus indicating a partial depinning of the Fermi level.

Chemical and electronic properties fo Fe/MgO/Ge heterostructures for spin electronics

PETTI, DANIELA;CANTONI, MATTEO;RINALDI, CHRISTIAN;BERTACCO, RICCARDO
2011-01-01

Abstract

We report on the chemical and electronic properties of epitaxial Fe/MgO/Ge(001) heterostructures probed by X-ray Photoemission Spectroscopy. At variance with the Fe/MgO/Fe system, annealing at 570 K produces a sizable interdiffusion at the upper Fe/MgO interface, while at 470 K this process is inhibited. The XPS analysis of band alignment in heterostructures annealed at 470 K grown onto an intrinsic Ge substrate indicates that the Fermi level is placed at the center of the MgO gap and that the Schottky barrier height is 0.35±0.1 eV, thus indicating a partial depinning of the Fermi level.
Chemical and electronic properties of Fe/MgO/Ge heterostructures for spin electronics
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11311/629785
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