GRAIN SIZE DETERMINATION OF SURFACE NANOCRYSTALLIZED METALS BY MEANS OF A PORTABLE X-RAY DIFFRACTOMETER

This paper addresses the use of a rapid and easily applicable single line-profile analysis technique that is able to separate size and strain line broadening effects. The method is based on representing the experimental data by a Voigt function that is a convolution of Cauchy (Lorenzian) and Gaussian functions which are generally used in diffraction profile analyses. The method provides the possibility of using portable X-ray diffraction units for breadth interpretation of diffraction line profiles. The method was applied to a surface nanocrystallized Al 7075 specimen and the results showed good agreement with the measurements performed by other techniques including in situ X-ray diffraction and Transmission electron microscopy.