This paper addresses the use of a rapid and easily applicable single line-profile analysis technique that is able to separate size and strain line broadening effects. The method is based on representing the experimental data by a Voigt function that is a convolution of Cauchy (Lorenzian) and Gaussian functions which are generally used in diffraction profile analyses. The method provides the possibility of using portable X-ray diffraction units for breadth interpretation of diffraction line profiles. The method was applied to a surface nanocrystallized Al 7075 specimen and the results showed good agreement with the measurements performed by other techniques including in situ X-ray diffraction and Transmission electron microscopy.

GRAIN SIZE DETERMINATION OF SURFACE NANOCRYSTALLIZED METALS BY MEANS OF A PORTABLE X-RAY DIFFRACTOMETER

BAGHERIFARD, SARA;GHELICHI, RAMIN;GUAGLIANO, MARIO
2011-01-01

Abstract

This paper addresses the use of a rapid and easily applicable single line-profile analysis technique that is able to separate size and strain line broadening effects. The method is based on representing the experimental data by a Voigt function that is a convolution of Cauchy (Lorenzian) and Gaussian functions which are generally used in diffraction profile analyses. The method provides the possibility of using portable X-ray diffraction units for breadth interpretation of diffraction line profiles. The method was applied to a surface nanocrystallized Al 7075 specimen and the results showed good agreement with the measurements performed by other techniques including in situ X-ray diffraction and Transmission electron microscopy.
2011
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11311/628985
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