Security systems based on face recognition through video surveillance systems deserve great interest. Their use is important in several areas including airport security, identification of individuals and access control to critical areas. These systems are based either on the measurement of details of a human face or on a global approach whereby faces are considered as a whole. The recognition is then performed by comparing the measured parameters with reference values stored in a database. The result of this comparison is not deterministic because measurement results are affected by uncertainty due to random variations and/or to systematic effects. In these circumstances the recognition of a face is subject to the risk of a faulty decision. Therefore, a proper metrological characterization is needed to improve the performance of such systems. Suitable methods are proposed for a quantitative metrological characterization of face measurement systems, on which recognition procedures are based. The proposed methods are applied to three different algorithms based either on linear discrimination, on eigenface analysis, or on feature detection.

Face-based recognition techniques: proposals for the metrological characterization of global and feature-based approaches

GASPARETTO, MICHELE;ZAPPA, EMANUELE;
2011-01-01

Abstract

Security systems based on face recognition through video surveillance systems deserve great interest. Their use is important in several areas including airport security, identification of individuals and access control to critical areas. These systems are based either on the measurement of details of a human face or on a global approach whereby faces are considered as a whole. The recognition is then performed by comparing the measured parameters with reference values stored in a database. The result of this comparison is not deterministic because measurement results are affected by uncertainty due to random variations and/or to systematic effects. In these circumstances the recognition of a face is subject to the risk of a faulty decision. Therefore, a proper metrological characterization is needed to improve the performance of such systems. Suitable methods are proposed for a quantitative metrological characterization of face measurement systems, on which recognition procedures are based. The proposed methods are applied to three different algorithms based either on linear discrimination, on eigenface analysis, or on feature detection.
2011
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11311/627588
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