In this paper a problem arising in the modelling of semiconductor devices motivates the study of singularly perturbed differential equations of reaction–diffusion type with discontinuous data. The solutions of such problems typically contain interior layers where the gradient of the solution changes rapidly. Parameter–uniform methods based on piecewise–uniform Shishkin meshes are constructed and analysed for such problems. Numerical results are presented to support the theoretical results and to illustrate the benefits of using a piecewise–uniform Shishkin mesh over the use of uniform meshes in the simulation of a simple semiconductor device.

Interior layers in a reaction-diffusion equation with a discontinuous diffusion coefficient

DE FALCO, CARLO;
2010-01-01

Abstract

In this paper a problem arising in the modelling of semiconductor devices motivates the study of singularly perturbed differential equations of reaction–diffusion type with discontinuous data. The solutions of such problems typically contain interior layers where the gradient of the solution changes rapidly. Parameter–uniform methods based on piecewise–uniform Shishkin meshes are constructed and analysed for such problems. Numerical results are presented to support the theoretical results and to illustrate the benefits of using a piecewise–uniform Shishkin mesh over the use of uniform meshes in the simulation of a simple semiconductor device.
2010
Diffusion Reaction Equations; Singularly Perturbed Differential Equations; Finite Difference Methods on Fitted Meshes
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11311/565446
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