Available experimental information deduced from indentation, performed on the external surface of a film-substrate system, is combined with the simulation of the test and the material parameters, entering the numerical model, are estimated by minimizing the difference between experimental and their computed counterparts.
Indentation and imprint mapping for the identification of interface properties in film-substrate systems
BOCCIARELLI, MASSIMILIANO;BOLZON, GABRIELLA
2009-01-01
Abstract
Available experimental information deduced from indentation, performed on the external surface of a film-substrate system, is combined with the simulation of the test and the material parameters, entering the numerical model, are estimated by minimizing the difference between experimental and their computed counterparts.File in questo prodotto:
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