Invited Speaker at the Conference on Measurements and Uncertainty Evaluation in Coordinate Measuring Machine (CMM) and Scanners and their Implication on Design and Reverse Engineering

Manufacturing Signature and CMM-based Inspection

MORONI, GIOVANNI;PACELLA, MASSIMO
2004

Abstract

Invited Speaker at the Conference on Measurements and Uncertainty Evaluation in Coordinate Measuring Machine (CMM) and Scanners and their Implication on Design and Reverse Engineering
2004 Israel-Italy Bi-National Conference on Measurements and Uncertainty Evaluation in Coordinate Measuring Machine (CMM) and Scanners and their Implication on Design and Reverse Engineering
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11311/534428
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