Invited Speaker at the Conference on Measurements and Uncertainty Evaluation in Coordinate Measuring Machine (CMM) and Scanners and their Implication on Design and Reverse Engineering
Manufacturing Signature and CMM-based Inspection
MORONI, GIOVANNI;PACELLA, MASSIMO
2004-01-01
Abstract
Invited Speaker at the Conference on Measurements and Uncertainty Evaluation in Coordinate Measuring Machine (CMM) and Scanners and their Implication on Design and Reverse EngineeringFile in questo prodotto:
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