Space resolved Stark spectroscopy is introduced as a non invasive optical technique for imaging electric field distribution in organic semiconductors. Stark spectroscopy relies on the electric field induced change in the absorption/reflection. It is shown that local monitoring of Stark shift with confocal spatial resolution provides quantitative information on the strength of the local field as well as charge distribution within the transport channel.

Imaging the electric field distribution in organic devices by confocal electroreflectance microscopy

CELEBRANO, MICHELE;SCIASCIA, CALOGERO;CERULLO, GIULIO NICOLA;ZAVELANI ROSSI, MARGHERITA;LANZANI, GUGLIELMO;
2009

Abstract

Space resolved Stark spectroscopy is introduced as a non invasive optical technique for imaging electric field distribution in organic semiconductors. Stark spectroscopy relies on the electric field induced change in the absorption/reflection. It is shown that local monitoring of Stark shift with confocal spatial resolution provides quantitative information on the strength of the local field as well as charge distribution within the transport channel.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11311/513443
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