Time resolved photon emission (TRE) has the potential to identify faults by analysing the emission as a function of time. TRE detectors provide time capabilities, but at the detriment of the spatial information. In order to localize the emission source (switching transistors), it is interesting to couple TRE with light emission microscopes. Based on a comparison of commercial TRE detectors and photon counting electronic modules, we present a cost effective implementation of TRE into a commercial microscope, with no hardware modifications.
Implementation of TRE systems into Emission Microscopes
TOSI, ALBERTO;ZAPPA, FRANCO
2004-01-01
Abstract
Time resolved photon emission (TRE) has the potential to identify faults by analysing the emission as a function of time. TRE detectors provide time capabilities, but at the detriment of the spatial information. In order to localize the emission source (switching transistors), it is interesting to couple TRE with light emission microscopes. Based on a comparison of commercial TRE detectors and photon counting electronic modules, we present a cost effective implementation of TRE into a commercial microscope, with no hardware modifications.File in questo prodotto:
| File | Dimensione | Formato | |
|---|---|---|---|
|
ESREF 2004 - PoliMI-CNES - Abstract.pdf
Accesso riservato
:
Altro materiale allegato
Dimensione
164.33 kB
Formato
Adobe PDF
|
164.33 kB | Adobe PDF | Visualizza/Apri |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
