The invention relates to an interferometry apparatus (100) for measuring at least one parameter of a sample (S) comprising: first (S1) and second (S2) sources, respectively, of first (So1) and second (So2) electromagnetic radiations, having distinct wavelengths and time coherences; interference means (50) of said radiations to provide a combination electromagnetic signal (Soc2) of first (Soi1) and second (Soi2) interference electromagnetic signals between portions, of first and second radiations, respectively. The apparatus being characterized in that it further comprises: a device (PD) for converting the combination electromagnetic signal (Soc2) into a corresponding combined electric signal (Sce) and separation electronic means (F-B) of the combined electric signal (SSoi2), respectively.
Apparato di interferometria a bassa coerenza sensibile alla fase
MELLONI, ANDREA IVANO;PERSIA, FILIPPO
2006-01-01
Abstract
The invention relates to an interferometry apparatus (100) for measuring at least one parameter of a sample (S) comprising: first (S1) and second (S2) sources, respectively, of first (So1) and second (So2) electromagnetic radiations, having distinct wavelengths and time coherences; interference means (50) of said radiations to provide a combination electromagnetic signal (Soc2) of first (Soi1) and second (Soi2) interference electromagnetic signals between portions, of first and second radiations, respectively. The apparatus being characterized in that it further comprises: a device (PD) for converting the combination electromagnetic signal (Soc2) into a corresponding combined electric signal (Sce) and separation electronic means (F-B) of the combined electric signal (SSoi2), respectively.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
