We exploited complementary synchrotron radiation spectroscopies to study the Yb 4f electronic configuration in three representative intermediate-valence materials: YbAl3, YbInCu4, and YbCu2Si2. High-resolution x-ray absorption PFY-XAS, resonant inelastic x-ray scattering RIXS, and hard-x-ray photoemission HAXPES data all show characteristic temperature-dependent changes of the Yb valence. For each material, the increments measured from low 20 K to high 300 K temperature by the different probes are quite similar. The estimated RIXS and XAS valences are consistently higher than the HAXPES values. We briefly discuss the possible origin of this discrepancy.

Comparison of bulk-sensitive spectroscopic probes of Yb valence in Kondo systems

DALLERA, CLAUDIA;CARPENE, ETTORE;GRIONI, MARCO
2007-01-01

Abstract

We exploited complementary synchrotron radiation spectroscopies to study the Yb 4f electronic configuration in three representative intermediate-valence materials: YbAl3, YbInCu4, and YbCu2Si2. High-resolution x-ray absorption PFY-XAS, resonant inelastic x-ray scattering RIXS, and hard-x-ray photoemission HAXPES data all show characteristic temperature-dependent changes of the Yb valence. For each material, the increments measured from low 20 K to high 300 K temperature by the different probes are quite similar. The estimated RIXS and XAS valences are consistently higher than the HAXPES values. We briefly discuss the possible origin of this discrepancy.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11311/260955
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