We assess a hyperspectral imaging system for characterizing biological tissue spectral properties. The setup comprises a hyperspectral camera (400-1000 ~nm) and two halogen lamps. First, we assess image quality by quantifying spatial inhomogeneity using an optically-homogeneous phantom. Second, we evaluate measurement robustness to varying objectivespecimen distance and lamp orientation. Finally, we evaluate the validity of the measurement system by comparing hyperspectral measurements of five colored Spectralon samples with reference data from a spectrometer. Our results demonstrate minimal spatial variability within the images (<3 % before data normalization, < 1% after data normalization) in the 500-900 ~nm range when measuring the homogeneous phantom, indicating artifact-free imaging. Additionally, the measured reflectance spectra exhibit low (<5 %) variability across different objective-specimen distances and lamp orientations, suggesting robustness to setup configuration changes. Finally, the spectral measurements of the Spectralon samples closely match the spectrometer reference data. These findings support the use of our system for material spectral characterization.
Assessment of a Hyperspectral Imaging System for Biological Tissue Characterization
Savazzi, Matteo;Diserò, Andrea;Lascurain, Paulina Guzmán García;Comelli, Daniela;Saccomandi, Paola
2025-01-01
Abstract
We assess a hyperspectral imaging system for characterizing biological tissue spectral properties. The setup comprises a hyperspectral camera (400-1000 ~nm) and two halogen lamps. First, we assess image quality by quantifying spatial inhomogeneity using an optically-homogeneous phantom. Second, we evaluate measurement robustness to varying objectivespecimen distance and lamp orientation. Finally, we evaluate the validity of the measurement system by comparing hyperspectral measurements of five colored Spectralon samples with reference data from a spectrometer. Our results demonstrate minimal spatial variability within the images (<3 % before data normalization, < 1% after data normalization) in the 500-900 ~nm range when measuring the homogeneous phantom, indicating artifact-free imaging. Additionally, the measured reflectance spectra exhibit low (<5 %) variability across different objective-specimen distances and lamp orientations, suggesting robustness to setup configuration changes. Finally, the spectral measurements of the Spectralon samples closely match the spectrometer reference data. These findings support the use of our system for material spectral characterization.| File | Dimensione | Formato | |
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