The EXFLU1 batch of LGAD sensors on substrates of thickness between 15 and 45μm were exposed to various radiation grades between 1 × 1014 and 5 × 1015 neqcm−2 using the TRIGA Mark II research nuclear reactor at the Jozef Stefan Institute. The sensor designs are optimised to preserve characteristics at high fluences. These sensors are manufactured by Fondazione Bruno Kessler. The latest studies of the effects of radiation have been performed, with particular focus on acceptor removal and gain evolution.
Characterisation of the FBK EXFLU1 thin sensors with gain in a high fluence environment
Borghi, Giacomo;
2024-01-01
Abstract
The EXFLU1 batch of LGAD sensors on substrates of thickness between 15 and 45μm were exposed to various radiation grades between 1 × 1014 and 5 × 1015 neqcm−2 using the TRIGA Mark II research nuclear reactor at the Jozef Stefan Institute. The sensor designs are optimised to preserve characteristics at high fluences. These sensors are manufactured by Fondazione Bruno Kessler. The latest studies of the effects of radiation have been performed, with particular focus on acceptor removal and gain evolution.File in questo prodotto:
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