A Generalized Testing Model for Interval Lifetime Analysis Based on Mixed Wiener Accelerated Degradation Process

To achieve fault diagnosis and prognosis, obtaining adequate and reliable life-cycle data is essential. However, this poses a challenge in current high-reliable Internet of Things (IoT) systems. Fortunately, accelerated degradation testing (ADT) can be employed to overcome this hurdle. Nevertheless, a dependable testing and measuring technique is required to construct an accurate model for ADT. This testing method plays a vital role in evaluating fault diagnosis, prognosis, lifetime, and maintenance decisions for reliable products under operational stress. To ensure effective testing, it is crucial to utilize appropriate models that account for the individual heterogeneity of products. However, the commonly used single stochastic models in ADT overlook the impact of this condition in real-world applications, resulting in misspecification problem. To address this limitation, we propose a novel mixed stochastic process model that integrates multi-Wiener processes and dynamic weights. In addition, we leverage interval analysis to analyze system lifetime, considering the limited data size. The estimation of unknown parameters in our mixed model is achieved using the Metropolis-Hastings algorithm. By analyzing stress relaxation data from electrical connectors, we demonstrate the superior accuracy of our mixed model over conventional single stochastic models in ADT.