Black-box models are employed to simulate the coupled clearing of a short-circuit fault by two breakers in back-up configuration. The novel feature of electromagnetic contact repulsion is introduced in the proposed black-box model of miniature circuit breakers to account for the anticipated contact opening before the mechanical actuation. Simulations agree with available experimental tests, predicting reliable current-peaks and let-through energy. A significant reduction of necessary and expensive lab tests is expected.

Black-Box Modeling of Back-Up Short-Circuit Tests

Bizzarri F.;Brambilla A.
2024-01-01

Abstract

Black-box models are employed to simulate the coupled clearing of a short-circuit fault by two breakers in back-up configuration. The novel feature of electromagnetic contact repulsion is introduced in the proposed black-box model of miniature circuit breakers to account for the anticipated contact opening before the mechanical actuation. Simulations agree with available experimental tests, predicting reliable current-peaks and let-through energy. A significant reduction of necessary and expensive lab tests is expected.
2024
back-up test
black-box model
let-through energy
Miniature circuit breaker
short-circuit fault
File in questo prodotto:
File Dimensione Formato  
Black-Box_Modeling_of_Back-Up_Short-Circuit_Tests.pdf

Accesso riservato

: Publisher’s version
Dimensione 1.12 MB
Formato Adobe PDF
1.12 MB Adobe PDF   Visualizza/Apri

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11311/1276470
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 0
  • ???jsp.display-item.citation.isi??? 0
social impact