Owing to the availability of bright X-rays sources such as the ESRF-EBS, inelastic X-ray scattering of samples contained in complex sample environments, including high pressure devices, has become feasible. Compared to well-established characterization techniques such as X-ray diffraction or X-ray absorption fine structure spectroscopy, inelastic X-ray scattering of samples under extreme conditions is a relatively novel probe. However, unique information about the electronic, magnetic, and local atomic structure is accessible with inelastic X-ray scattering. Here, capabilities of beamline ID20 of the ESRF in the field of high pressure inelastic X-ray scattering are presented and some recent activities are reviewed.
ID20 – opportunities for inelastic X-ray scattering at extreme conditions
Moretti Sala, Marco;
2024-01-01
Abstract
Owing to the availability of bright X-rays sources such as the ESRF-EBS, inelastic X-ray scattering of samples contained in complex sample environments, including high pressure devices, has become feasible. Compared to well-established characterization techniques such as X-ray diffraction or X-ray absorption fine structure spectroscopy, inelastic X-ray scattering of samples under extreme conditions is a relatively novel probe. However, unique information about the electronic, magnetic, and local atomic structure is accessible with inelastic X-ray scattering. Here, capabilities of beamline ID20 of the ESRF in the field of high pressure inelastic X-ray scattering are presented and some recent activities are reviewed.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
