A novel method to perform both electrical and optical testing of Photonic Circuit is presented. The use of probe card to electrically access and characterize the device enables the execution of a new approach for the calibration and cloning of filter-based devices.
Automatic Testing of a Silicon Photonic Reconfigurable Add/Drop Multiplexer
Petrini, Matteo;Baldi, Rita;Morichetti, Francesco;Melloni, Andrea
2022-01-01
Abstract
A novel method to perform both electrical and optical testing of Photonic Circuit is presented. The use of probe card to electrically access and characterize the device enables the execution of a new approach for the calibration and cloning of filter-based devices.File in questo prodotto:
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