A novel method to perform both electrical and optical testing of Photonic Circuit is presented. The use of probe card to electrically access and characterize the device enables the execution of a new approach for the calibration and cloning of filter-based devices.

Automatic Testing of a Silicon Photonic Reconfigurable Add/Drop Multiplexer

Petrini, Matteo;Baldi, Rita;Morichetti, Francesco;Melloni, Andrea
2022-01-01

Abstract

A novel method to perform both electrical and optical testing of Photonic Circuit is presented. The use of probe card to electrically access and characterize the device enables the execution of a new approach for the calibration and cloning of filter-based devices.
2022
2022 IEEE Photonics Society Summer Topicals Meeting Series (SUM)
978-1-6654-3489-8
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11311/1234084
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