The paper presents an original method for the precise charaterization of orthomode transducers with special focus to their isolation figures. This technique is based on 6 two-port measurements, 4 of which are already traditionally used to obtain approximate estimates of the scattering parameters. Unlike direct measurements or other techniques, the components required by the proposed procedure are commonly available in a standard RF laboratory thus allowing precise characterization of manufactured prototypes with cheap hardware.

Cheap method for accurate characterization of orthomode transducers

Oldoni M.;
2016-01-01

Abstract

The paper presents an original method for the precise charaterization of orthomode transducers with special focus to their isolation figures. This technique is based on 6 two-port measurements, 4 of which are already traditionally used to obtain approximate estimates of the scattering parameters. Unlike direct measurements or other techniques, the components required by the proposed procedure are commonly available in a standard RF laboratory thus allowing precise characterization of manufactured prototypes with cheap hardware.
2016
IEEE MTT-S International Microwave Symposium Digest
978-1-5090-0698-4
characterization
measurement
Orthomode transducers
polarization
polarization duplexing
waveguide
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11311/1218836
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