We present a wide-field imaging technique recently developed by us to measure quantitatively the optical ex- tinction cross section σext of individual nanoparticles. The technique is simple, high speed, and enables the simultaneous acquisition of hundreds of nanoparticles in the wide-field image for statistical analysis, with a sen- sitivity corresponding to the detection of a single gold nanoparticle down to 2 nm diameter. Notably, the method is applicable to any nanoparticle (dielectric, semiconducting, metallic), and can be easily and cost-effectively implemented on a conventional wide-field microscope. Of specific significance for accurate quantification, we show that σext depends on the numerical aperture of the microscope illumination due to the oblique incidence, even for spherical particles in an isotropic environment. This ”long shadow” effect needs to be taken into account when comparing σext to theoretical values calculated under plane wave illumination at normal incidence. Owing to the accurate experimental quantification of σext, one can then use it to determine the nanoparticle size, as demonstrated here on gold nanoparticles of 30 nm nominal diameter. This technique thus has the potential to become a simple and cost-effective new tool for accurate size characterization of single small nanoparticles, complementing time-consuming and expensive methods such as electron microscopy.

Quantitative high-throughput optical sizing of individual colloidal nanoparticles by wide-field imaging extinction microscopy

Zilli A.;
2019-01-01

Abstract

We present a wide-field imaging technique recently developed by us to measure quantitatively the optical ex- tinction cross section σext of individual nanoparticles. The technique is simple, high speed, and enables the simultaneous acquisition of hundreds of nanoparticles in the wide-field image for statistical analysis, with a sen- sitivity corresponding to the detection of a single gold nanoparticle down to 2 nm diameter. Notably, the method is applicable to any nanoparticle (dielectric, semiconducting, metallic), and can be easily and cost-effectively implemented on a conventional wide-field microscope. Of specific significance for accurate quantification, we show that σext depends on the numerical aperture of the microscope illumination due to the oblique incidence, even for spherical particles in an isotropic environment. This ”long shadow” effect needs to be taken into account when comparing σext to theoretical values calculated under plane wave illumination at normal incidence. Owing to the accurate experimental quantification of σext, one can then use it to determine the nanoparticle size, as demonstrated here on gold nanoparticles of 30 nm nominal diameter. This technique thus has the potential to become a simple and cost-effective new tool for accurate size characterization of single small nanoparticles, complementing time-consuming and expensive methods such as electron microscopy.
2019
Proceedings of SPIE Vol. 10892, Colloidal Nanoparticles for Biomedical Applications XIV
9781510624269
9781510624276
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11311/1218024
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