We present an InGaAs/InP single-photon avalanche diode (SPAD) with high photon detection efficiency and low noise for fiber-based quantum optics applications. Compared to previous InGaAs/InP SPADs, the InGaAs absorption layer is thicker, to maximize the quantum efficiency. The double zinc diffusion has been adjusted to avoid premature edge breakdown, with the help of a guard ring structure. Our detector achieves a photon detection efficiency up to 50% at 1550 nm, with a dark count rate of 20 kcps and a timing jitter of ∼ 70 ps (FWHM) at 225 K. Alternatively, it features a photon detection efficiency of 37% at 1550 nm, with a dark count rate of just 3 kcps and a timing jitter of ∼ 100 ps (FWHM). When combined with a custom integrated circuit, afterpulsing probability is as low as few percent with a gating frequency of 1 MHz and hold-off time of few microseconds at 225 K, allowing to achieve a photon count rate of almost 1 Mcps.

InGaAs/InP SPAD detecting single photons at 1550 nm with up to 50% efficiency and low noise

F. Signorelli;F. Telesca;E. Conca;A. Tosi
2021-01-01

Abstract

We present an InGaAs/InP single-photon avalanche diode (SPAD) with high photon detection efficiency and low noise for fiber-based quantum optics applications. Compared to previous InGaAs/InP SPADs, the InGaAs absorption layer is thicker, to maximize the quantum efficiency. The double zinc diffusion has been adjusted to avoid premature edge breakdown, with the help of a guard ring structure. Our detector achieves a photon detection efficiency up to 50% at 1550 nm, with a dark count rate of 20 kcps and a timing jitter of ∼ 70 ps (FWHM) at 225 K. Alternatively, it features a photon detection efficiency of 37% at 1550 nm, with a dark count rate of just 3 kcps and a timing jitter of ∼ 100 ps (FWHM). When combined with a custom integrated circuit, afterpulsing probability is as low as few percent with a gating frequency of 1 MHz and hold-off time of few microseconds at 225 K, allowing to achieve a photon count rate of almost 1 Mcps.
2021
2021 IEEE International Electron Devices Meeting (IEDM)
sezele, SPAD, InGaAs/InP SPAD
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11311/1206454
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