In this work, studies of the optical constants of monolayer transition metal dichalcogenides and few-layer black phosphorus are briefly reviewed, with particular emphasis on the complex dielectric function and refractive index. Specifically, an estimate of the complex index of refraction of phosphorene and few-layer black phosphorus is given. The complex index of refraction of this material was extracted from differential reflectance data reported in the literature by employing a constrained Kramers–Kronig analysis combined with the transfer matrix method. The reflectance contrast of 1–3 layers of black phosphorus on a silicon dioxide/silicon substrate was then calculated using the extracted complex indices of refraction.
|Titolo:||Anisotropic complex refractive indices of atomically thin materials: Determination of the optical constants of few-layer black phosphorus|
|Data di pubblicazione:||2020|
|Appare nelle tipologie:||01.1 Articolo in Rivista|
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|Ross et al. - 2020 - Anisotropic Complex Refractive Indices of Atomical.pdf||Publisher’s version||Accesso apertoVisualizza/Apri|