Dielectric Parameter Estimation at Ka-Band using Bayesian Inversion Method

This paper presents the estimation of dielectric material properties such as relative permittivity and thickness, using the well-known Bayesian inversion method. The free space measurements are conducted to obtain the S-parameters of the materials under test and passed forward to the time domain Bayesian inversion process to estimate the material properties and show the confidence on the accuracy of the results. The measurements were carried out at Ka (26-40GHz) band using commercial Vector Network Analyzer and MATLAB was used for post-processing of results. This method can provide better accuracy and improvement in Nondestructive Testing (NDT) and various quality control systems.