Synthetic antiferromagnets (SAF) are widely used for a plethora of applications among which data storage, computing, and in the emerging field of magnonics. In this framework, controlling the magnetic properties of SAFs via localized thermal treatments represents a promising route for building novel magnonic materials. In this paper, we study via vibration sample magnetometry the temperature dependence of the magnetic properties of sputtered exchange bias SAFs grown via magnetron sputtering varying the ferromagnetic layers and spacer thickness. Interestingly, we observe a strong, reversible modulation of the exchange field, saturation field, and coupling strength upon heating up to 250 °C. These results suggest that exchange bias SAFs represent promising systems for developing novel artificial magnetic nanomaterials via localized thermal treatment.

Temperature dependence of the magnetic properties of IrMn/CoFeB/Ru/CoFeB exchange biased synthetic antiferromagnets

Albisetti E.;Rinaldi C.;Cantoni M.;Bertacco R.;Petti D.
2020-01-01

Abstract

Synthetic antiferromagnets (SAF) are widely used for a plethora of applications among which data storage, computing, and in the emerging field of magnonics. In this framework, controlling the magnetic properties of SAFs via localized thermal treatments represents a promising route for building novel magnonic materials. In this paper, we study via vibration sample magnetometry the temperature dependence of the magnetic properties of sputtered exchange bias SAFs grown via magnetron sputtering varying the ferromagnetic layers and spacer thickness. Interestingly, we observe a strong, reversible modulation of the exchange field, saturation field, and coupling strength upon heating up to 250 °C. These results suggest that exchange bias SAFs represent promising systems for developing novel artificial magnetic nanomaterials via localized thermal treatment.
2020
CoFeB; Exchange bias; Interlayer exchange coupling; Magnetron sputtering; Synthetic antiferromagnet; Thermally assisted magnetic scanning probe lithography; Vibrating sample magnetometry
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11311/1135938
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