This work presents the latest findings of an ongoing research project Billé et al. [1] where the angular dependence of XRF detection could be exploited for the topographical study of the specimen. It presents the results of a simulation framework and of measurements performed with a new detector system [2] deployed on the TwinMic beamline [3] (Elettra Sincrotrone Trieste, Trieste, Italy).
XRF topography information: Simulations and data from a novel silicon drift detector system
Gandola, M.;Borghi, G.;Bertuccio, G.;
2019-01-01
Abstract
This work presents the latest findings of an ongoing research project Billé et al. [1] where the angular dependence of XRF detection could be exploited for the topographical study of the specimen. It presents the results of a simulation framework and of measurements performed with a new detector system [2] deployed on the TwinMic beamline [3] (Elettra Sincrotrone Trieste, Trieste, Italy).File in questo prodotto:
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