Fast fully integrated electronics for time-resolved imaging with highperformance single photon avalanche diodes

Single photon counting and timing are powerful tools in many applications. In recent years, there has been a fast trend towards the development of multichannel systems. Parallelism, indeed, can speed up the measurement and it allows advanced measurements based on the simultaneous acquisition of multiple wavelengths or multiple spots of the same sample at the same time. However, there currently is a tradeoff between number of channels and performance mainly because systems with hundreds of pixels have been developed so far relying on the exploitation of the standard CMOS technology to integrate both the detector and the electronics on the same chip. A breakthrough in this field would be the exploitation of different technologies, each one specifically selected to optimize a different part of the acquisition chain. In particular, we present fast fully integrated electronics able to operate external custom technology SPAD detectors to achieve high performance.