We report the first third order nonlinear characterization of Ge-rich Si1-xGex waveguides, with Germanium concentrations ranging from 0.7 to 0.9. A bidirectional top hat D-Scan method was used to determine the waveguide nonlinear parameters and to deduce the Kerr nonlinear refractive index and the two-photon absorption coefficient at the wavelength of 1.58 μm.
Nonlinear properties of Ge-rich SiGe waveguides
Frigerio, Jacopo;Ballabio, Andrea;Isella, Giovanni;
2017-01-01
Abstract
We report the first third order nonlinear characterization of Ge-rich Si1-xGex waveguides, with Germanium concentrations ranging from 0.7 to 0.9. A bidirectional top hat D-Scan method was used to determine the waveguide nonlinear parameters and to deduce the Kerr nonlinear refractive index and the two-photon absorption coefficient at the wavelength of 1.58 μm.File in questo prodotto:
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