This work presents the design of a high-power and intensive single chip integrated Laser Diode Driver (LDD) under fabrication in 160 nm Bipolar-CMOS-DMOS (BCD) technology for the direct time of flight (TOF) measurement in Light Detection and Ranging (LiDAR) application. The LDD can produce a fully programmable sharp current pulses up to 20 A with less than 1 ns duration and a repetition rate of 40 MHz. Additionally, a current DAC is embedded to provide the threshold current required to bias laser diode above its threshold current to improve the response time of the laser diode.

A 20 A Sub-nanosecond Integrated CMOS Laser Diode Driver for High Repetition Rate SPAD-Based Direct Time-of-Flight Measurements

TAJFAR, ALIREZA;F. Villa;F. Zappa
2018-01-01

Abstract

This work presents the design of a high-power and intensive single chip integrated Laser Diode Driver (LDD) under fabrication in 160 nm Bipolar-CMOS-DMOS (BCD) technology for the direct time of flight (TOF) measurement in Light Detection and Ranging (LiDAR) application. The LDD can produce a fully programmable sharp current pulses up to 20 A with less than 1 ns duration and a repetition rate of 40 MHz. Additionally, a current DAC is embedded to provide the threshold current required to bias laser diode above its threshold current to improve the response time of the laser diode.
2018
2018 INTERNATIONAL CONFERENCE ON COMPUTING, ELECTRONICS & COMMUNICATIONS ENGINEERING (ICCECE)
Sub nanosecond pulse; current pulse; pulsed laser diode driver; TOF; LiDAR;
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11311/1061363
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