Fast and accurate statistical estimation of common mode voltages and currents in weakly non-uniform differential interconnects

In this work, an approximate procedure for the fast evaluation of modal voltages and currents induced at the terminations of non-ideal differential interconnects is proposed. The procedure is exploited in combination with Monte Carlo simulations, in order to efficiently obtain statistical estimates of undesired common mode voltages and currents arising from asymmetries and non-uniformities introduced by the manufacturing process. Compared to the standard solution method, the proposed procedure allows a significant reduction of computational times, while retaining the same prediction accuracy.