The use of Triple Modular Redundancy (TMR) was historically introduced long time ago for improving reliability of computer systems [1]. Recently, the advances in miniaturizing of CMOS devices made digital circuits more and more unreliable. The current trend goes towards the Internet of Things and the cloud computing, where small devices have high requirements in terms of reduced power consumption and increased reliability [2]. Classical TMR solutions allow for high reliability but they cannot satisfy low-power require-ments, since they consume about three times more than the equivalent single device. However, the type of applications that are implemented in the new cloud scenario do not require high reliability all the time, but it can be assumed that some computations are more important, and thus require to be executed by a reliable hardware, while other computations are less important, and thus they can tolerate failures [3]. © 2014 IEEE.

A novel adaptive fault tolerant flip-flop architecture based on TMR

Cassano, Luca;
2014-01-01

Abstract

The use of Triple Modular Redundancy (TMR) was historically introduced long time ago for improving reliability of computer systems [1]. Recently, the advances in miniaturizing of CMOS devices made digital circuits more and more unreliable. The current trend goes towards the Internet of Things and the cloud computing, where small devices have high requirements in terms of reduced power consumption and increased reliability [2]. Classical TMR solutions allow for high reliability but they cannot satisfy low-power require-ments, since they consume about three times more than the equivalent single device. However, the type of applications that are implemented in the new cloud scenario do not require high reliability all the time, but it can be assumed that some computations are more important, and thus require to be executed by a reliable hardware, while other computations are less important, and thus they can tolerate failures [3]. © 2014 IEEE.
2014
Proceedings - 2014 19th IEEE European Test Symposium, ETS 2014
9781479934157
Safety, Risk, Reliability and Quality
File in questo prodotto:
File Dimensione Formato  
ETS2014.pdf

Accesso riservato

: Publisher’s version
Dimensione 328.56 kB
Formato Adobe PDF
328.56 kB Adobe PDF   Visualizza/Apri

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11311/1043213
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 3
  • ???jsp.display-item.citation.isi??? 2
social impact