In this work the calibration of the directional Raman strain shift coefficient for tensile strained Ge microstructures is reported. The strain shift coefficient is retrieved from micro-Raman spectroscopy measurements in combination with absolute strain measurements from x-ray diffraction using focused synchrotron radiation. The results are used to fit the phonon deformation potentials. A linear dependence of the phonon deformation potentials p and q is revealed. The method can be extended to provide strain calibration of Raman experiments also in other material system.

Determining the directional strain shift coefficients for tensile Ge: A combined x-ray diffraction and Raman spectroscopy study

Frigerio, Jacopo;
2017

Abstract

In this work the calibration of the directional Raman strain shift coefficient for tensile strained Ge microstructures is reported. The strain shift coefficient is retrieved from micro-Raman spectroscopy measurements in combination with absolute strain measurements from x-ray diffraction using focused synchrotron radiation. The results are used to fit the phonon deformation potentials. A linear dependence of the phonon deformation potentials p and q is revealed. The method can be extended to provide strain calibration of Raman experiments also in other material system.
MEASUREMENT SCIENCE & TECHNOLOGY
local strain measurement; phonon deformation potentials; Raman; tensile germanium; x-ray diffraction; Instrumentation; Applied Mathematics
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11311/1036390
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