On the upgraded ESRF soft x-ray beamline ID32 a new spectrometer for Resonant X-ray Inelastic Scattering (RIXS) will be installed. To operate in fully polarized mode, a polarimeter will be inserted in the instrument to measure simultaneously the energy spectra and the linear polarization. The new spectrometer works between 500 eV and 1000 eV and requires graded multilayers to optimize the energy tunability and the polarization sensitivity. The present work covers the design, the fabrication, and the characterization of the multilayers. Performance evaluations during test and commissioning experiments with soft x-rays complement the paper.

Graded multilayers for fully polarization resolved Resonant Inelastic X-ray Scattering in the soft x-ray range

BRAICOVICH, LUCIO;GHIRINGHELLI, GIACOMO CLAUDIO;
2014-01-01

Abstract

On the upgraded ESRF soft x-ray beamline ID32 a new spectrometer for Resonant X-ray Inelastic Scattering (RIXS) will be installed. To operate in fully polarized mode, a polarimeter will be inserted in the instrument to measure simultaneously the energy spectra and the linear polarization. The new spectrometer works between 500 eV and 1000 eV and requires graded multilayers to optimize the energy tunability and the polarization sensitivity. The present work covers the design, the fabrication, and the characterization of the multilayers. Performance evaluations during test and commissioning experiments with soft x-rays complement the paper.
2014
Advances in X-Ray/EUV Optics and Components IX
Sputter deposition; X-ray multilayers; X-ray optics; X-ray polarization analyzer; Applied Mathematics; Computer Science Applications1707 Computer Vision and Pattern Recognition; Electrical and Electronic Engineering; Electronic, Optical and Magnetic Materials; Condensed Matter Physics
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11311/1014865
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