The potential of resonant inelastic soft x-ray scattering to measure 4f crystal electric-field excitation spectra in Ce Kondo lattices has been examined. Spectra have been obtained for several Ce systems and show a well-defined structure determined by crystal-field, spin-orbit, and charge-transfer excitations only. The spectral shapes of the excitation spectra can be well understood in the framework of atomic multiplet calculations. For CeCu2Si2 we found notable disagreement between the inelastic x-ray-scattering spectra and theoretical calculations when using the crystal-field scheme proposed from inelastic neutron scattering. Modified sets of crystal-field parameters yield better agreement. Our results also show that, with the very recent improvements of soft x-ray spectrometers in resolution to below 30 meV at the Ce M4,5 edges, resonant inelastic x-ray scattering could be an ideal tool to determine the crystal-field scheme in Ce Kondo lattices and other rare-earth compounds.
|Titolo:||4f excitations in Ce Kondo lattices studied by resonant inelastic x-ray scattering|
|Data di pubblicazione:||2016|
|Appare nelle tipologie:||01.1 Articolo in Rivista|
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|PhysRevB.93.165134 (Amorese RIXS of Ce compounds at ID08).pdf||Publisher’s version||Accesso apertoVisualizza/Apri|