PAVAN, PAOLO
PAVAN, PAOLO
Recommended Methods to Study Resistive Switching Devices
2019-01-01 Lanza, Mario; Wong, H. -S. Philip; Pop, Eric; Ielmini, Daniele; Strukov, Dimitri; Regan, Brian C.; Larcher, Luca; Villena, Marco A.; Yang, J. Joshua; Goux, Ludovic; Belmonte, Attilio; Yang, Yuchao; Puglisi, Francesco M.; Kang, Jinfeng; Magyari-Köpe, Blanka; Yalon, Eilam; Kenyon, Anthony; Buckwell, Mark; Mehonic, Adnan; Shluger, Alexander; Li, Haitong; Hou, Tuo-Hung; Hudec, Boris; Akinwande, Deji; Ge, Ruijing; Ambrogio, Stefano; Roldan, Juan B.; Miranda, Enrique; Suñe, Jordi; Pey, Kin Leong; Wu, Xing; Raghavan, Nagarajan; Wu, Ernest; Lu, Wei D.; Navarro, Gabriele; Zhang, Weidong; Wu, Huaqiang; Li, Runwei; Holleitner, Alexander; Wurstbauer, Ursula; Lemme, Max C.; Liu, Ming; Long, Shibing; Liu, Qi; Lv, Hangbing; Padovani, Andrea; Pavan, Paolo; Valov, Ilia; Xu, Jing; Han, Tingting; Zhu, Kaichen; Chen, Shaochuan; Hui, Fei; Shi, Yuanyuan
Reliability of Logic-in-Memory Circuits in Resistive Memory Arrays
2020-01-01 Zanotti, Tommaso; Zambelli, Cristian; Puglisi, Francesco Maria; Milo, Valerio; Perez, Eduardo; Mahadevaiah, Mamathamba K.; Ossorio, Oscar G.; Wenger, Christian; Pavan, Paolo; Olivo, Piero; Ielmini, Daniele
| Titolo | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Recommended Methods to Study Resistive Switching Devices | 1-gen-2019 | Ielmini, DanieleAmbrogio, StefanoLiu, MingLIU, QIPAVAN, PAOLOXU, JING + | |
| Reliability of Logic-in-Memory Circuits in Resistive Memory Arrays | 1-gen-2020 | Zambelli, CristianMilo, ValerioPavan, PaoloIelmini, Daniele + |