AFSHAR, ERFAN
 Distribuzione geografica
Continente #
NA - Nord America 110
EU - Europa 78
AS - Asia 24
Continente sconosciuto - Info sul continente non disponibili 13
SA - Sud America 2
Totale 227
Nazione #
US - Stati Uniti d'America 101
IT - Italia 60
JP - Giappone 10
SE - Svezia 8
CN - Cina 7
SG - Singapore 5
DE - Germania 4
CA - Canada 3
BR - Brasile 2
FI - Finlandia 2
NL - Olanda 2
AG - Antigua e Barbuda 1
BB - Barbados 1
CR - Costa Rica 1
CU - Cuba 1
DK - Danimarca 1
GB - Regno Unito 1
HK - Hong Kong 1
JM - Giamaica 1
KR - Corea 1
TT - Trinidad e Tobago 1
Totale 214
Città #
Milan 19
San Jose 14
Phoenix 9
Ashburn 8
Council Bluffs 8
Singapore 5
Tokyo 5
Amsterdam 2
Bari 2
Boardman 2
Bologna 2
Brasília 2
Eschborn 2
Göttingen 2
Miano 2
Naples 2
Osaka 2
Alsip 1
Beijing 1
Bridgeton 1
Bridgetown 1
Catania 1
Chaguanas 1
Chicago 1
Dallas 1
Decatur 1
Fresno 1
Fullerton 1
Greenfield Park 1
Guagnano 1
Hamilton 1
Hangzhou 1
Havana 1
Ipswich 1
Jyväskylä 1
La Feria 1
Legnano 1
Lehigh Acres 1
Lincoln 1
Malonno 1
Marion 1
Miami 1
Montego Bay 1
Mount Vernon 1
New York 1
Newark 1
Palermo 1
Philadelphia 1
Powder Springs 1
Princeton 1
Salt Lake City 1
San José 1
Santa Clara 1
Seoul 1
St John's 1
St. Cloud 1
Summerville 1
Taunton 1
Toronto 1
Valley 1
Warminster 1
Warner Robins 1
Westland 1
Totale 134
Nome #
Secondary-Electron-Energy-Spectroscopy (SEES) for Semiconductor Surface Defect Characterization 47
Graphene Membrane Electrochemical Cell for High-Vacuum SEM Observation of Electrocatalytic Reactions 37
IM1-P-7 Quantum state secondary electron emission spectroscopy in low voltage scanning electron microscope for probing Valence band 31
IM1-O-3 Perspectives of ultrafast hyperspectral imaging in Scanning Electron Microscopy 30
IM3-P-8 Surface and sub-surface defect analysis in semiconductors by Secondary Electron Emission Spectroscopy and local charge transport mapping 22
Surface-sensitive secondary electron emission spectroscopy in low voltage scanning electron microscope for Valence Band analysis 21
High-Vacuum Scanning Electron Microscopy Characterization of Electrochemical Reactions 20
Surface and sub-surface defect analysis in semiconductors by Secondary Electron Emission Spectroscopy and local charge transport mapping 19
Totale 227
Categoria #
all - tutte 505
article - articoli 0
book - libri 0
conference - conferenze 505
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 1.010


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2026/2027227 0 163 64 0 0 0 0 0 0 0 0 0
Totale 227