KLATKA, TOMASZ
KLATKA, TOMASZ
DIPARTIMENTO DI ELETTRONICA E INFORMAZIONE (attivo dal 01/01/1900 al 31/12/2012)
Elemental Mapping by means of an Ultra-fast XRF Spectrometer based on a new high-performance monolithic array of Silicon Drift Detectors
2007-01-01 Alberti, Roberto; Fiorini, CARLO ETTORE; Guazzoni, Chiara; Klatka, Tomasz; Longoni, ANTONIO FRANCESCO
External scanning micro-PIXE for the characterization of a polycapillary lens: Measurement of the collected X-ray intensity distribution
2010-01-01 N., Grassi; Guazzoni, Chiara; Alberti, Roberto; Klatka, Tomasz; A., Bjeoumikhov
Optimized readout configuration for PIXE spectrometers based on Silicon Drift Detectors: Architecture and performance
2009-01-01 Alberti, Roberto; N., Grassi; Guazzoni, Chiara; Klatka, Tomasz
Performance Evaluation of an Advanced XRF Elemental Mapping System Featuring a Novel Ring-Shaped Monolithic Array of Silicon Drift Detectors
2007-01-01 Alberti, Roberto; Buzzetti, Siro; Fiorini, CARLO ETTORE; Guazzoni, Chiara; Klatka, Tomasz; P., Lechner; Longoni, ANTONIO FRANCESCO; L., Strüder
USB 2.0 data acquisition system for high-speed X-ray elemental mapping
2008-01-01 Alberti, Roberto; Guazzoni, Chiara; Klatka, Tomasz
Use of silicon drift detectors for the detection of medium-light elements in PIXE
2008-01-01 Alberti, Roberto; A., Bjeoumikhov; N., Grassi; Guazzoni, Chiara; Klatka, Tomasz; Longoni, ANTONIO FRANCESCO; Quattrone, Antonino