CACCHIONE, FABRIZIO
CACCHIONE, FABRIZIO
Decoupled three-scale approach to MEMS failure, A
2007-01-01 Cacchione, Fabrizio; Corigliano, Alberto; Ghisi, ALDO FRANCESCO; Mariani, Stefano
In-plane and out-of-plane mechanical characterization of thin polysilicon
2005-01-01 Cacchione, Fabrizio; Corigliano, Alberto; B., De Masi; M., Ferrera; A., Vinay
Material characterisation at the micro scale through on-chip tests
2005-01-01 Cacchione, Fabrizio; Corigliano, Alberto; B., De Masi; M., Ferrera
Micro-scale simulation of impact rupture in polysilicon MEMS
2006-01-01 Cacchione, Fabrizio; Corigliano, Alberto; B., De Masi; Frangi, ATTILIO ALBERTO
On-chip electrostatically actuated bending tests for the mechanical characterization of polysilicon at the microscale
2006-01-01 Cacchione, Fabrizio; Corigliano, Alberto; B., De Masi; C., Riva
On-chip tests for the mechanical characterization of polysilicon at the microscale
2005-01-01 Cacchione, Fabrizio; Corigliano, Alberto; B., De Masi; C., Riva
Out of plane flexural behaviour of thin polysilicon films: mechanical characterization and application of the Weibull approach
2005-01-01 Cacchione, Fabrizio; Corigliano, Alberto; B., De Masi; M., Ferrera
Out of plane flexural behaviour of thin polysilicon films: mechanical characterization and application of the Weibull approach
2006-01-01 Cacchione, Fabrizio; Corigliano, Alberto; B., De Masi; M., Ferrera
Out of plane vs. in plane flexural behaviour of thin polysilicon films: mechanical characterization and application of the Weibull approach
2005-01-01 Cacchione, Fabrizio; Corigliano, Alberto; B., De Masi; C., Riva
Parametric study of fracture properties in polycrystalline MEMS
2007-01-01 Cacchione, Fabrizio; Corigliano, Alberto; S., Zerbini
Reliability analysis of MEMS sensors subject to drop impact
2007-01-01 Cacchione, Fabrizio; Corigliano, Alberto; F., Fachin; Ghisi, ALDO FRANCESCO; S., Zerbini
Rupture tests on polysilicon films through on-chip electrostatic actuation
2004-01-01 Cacchione, Fabrizio; Corigliano, Alberto; B., De Masi; M., Ferrera
Rupture tests on polysilicon films through on-chip electrostatic actuation
2006-01-01 Cacchione, Fabrizio; B., DE MASI; Corigliano, Alberto; M., Ferrera
Simulation of impact rupture in polysilicon MEMS
2006-01-01 Cacchione, Fabrizio; Corigliano, Alberto; Frangi, ATTILIO ALBERTO; S., Zerbini