statistiche ricercatore

Nome	#
Rupture tests on polysilicon films through on-chip electrostatic actuation	110
Out of plane flexural behaviour of thin polysilicon films: mechanical characterization and application of the Weibull approach	98
Simulation of impact rupture in polysilicon MEMS	94
On-chip electrostatically actuated bending tests for the mechanical characterization of polysilicon at the microscale	91
Parametric study of fracture properties in polycrystalline MEMS	89
Out of plane flexural behaviour of thin polysilicon films: mechanical characterization and application of the Weibull approach	70
On-chip tests for the mechanical characterization of polysilicon at the microscale	69
Micro-scale simulation of impact rupture in polysilicon MEMS	69
Material characterisation at the micro scale through on-chip tests	67
Rupture tests on polysilicon films through on-chip electrostatic actuation	67
Out of plane vs. in plane flexural behaviour of thin polysilicon films: mechanical characterization and application of the Weibull approach	65
Decoupled three-scale approach to MEMS failure, A	62
Reliability analysis of MEMS sensors subject to drop impact	52
In-plane and out-of-plane mechanical characterization of thin polysilicon	44
Totale	1.047

	Totale	Lug	Ago	Sett	Ott	Nov	Dic	Gen	Feb	Mar	Apr	Mag	Giu
2018/2019	64	0	0	0	0	0	0	0	0	0	0	35	29
2019/2020	288	12	21	9	23	32	49	40	21	36	9	22	14
2020/2021	155	16	7	17	5	30	5	15	17	6	20	11	6
2021/2022	128	4	10	7	4	43	5	3	5	7	6	11	23
2022/2023	156	13	2	3	20	19	35	0	13	30	4	10	7
2023/2024	48	3	13	3	6	7	12	3	0	0	1	0	0
Totale													1.047

RE.PUBLIC@POLIMI pubblicazioni di ricerca del Politecnico di Milano