statistiche ricercatore

Nome	#
Rupture tests on polysilicon films through on-chip electrostatic actuation	112
Out of plane flexural behaviour of thin polysilicon films: mechanical characterization and application of the Weibull approach	100
Simulation of impact rupture in polysilicon MEMS	96
On-chip electrostatically actuated bending tests for the mechanical characterization of polysilicon at the microscale	93
Parametric study of fracture properties in polycrystalline MEMS	91
On-chip tests for the mechanical characterization of polysilicon at the microscale	72
Out of plane flexural behaviour of thin polysilicon films: mechanical characterization and application of the Weibull approach	72
Micro-scale simulation of impact rupture in polysilicon MEMS	71
Material characterisation at the micro scale through on-chip tests	70
Rupture tests on polysilicon films through on-chip electrostatic actuation	69
Decoupled three-scale approach to MEMS failure, A	68
Out of plane vs. in plane flexural behaviour of thin polysilicon films: mechanical characterization and application of the Weibull approach	68
Reliability analysis of MEMS sensors subject to drop impact	54
In-plane and out-of-plane mechanical characterization of thin polysilicon	46
Totale	1.082

	Totale	Lug	Ago	Sett	Ott	Nov	Dic	Gen	Feb	Mar	Apr	Mag	Giu
2019/2020	223	0	0	0	0	32	49	40	21	36	9	22	14
2020/2021	155	16	7	17	5	30	5	15	17	6	20	11	6
2021/2022	128	4	10	7	4	43	5	3	5	7	6	11	23
2022/2023	156	13	2	3	20	19	35	0	13	30	4	10	7
2023/2024	49	3	13	3	6	7	12	3	0	0	1	0	1
2024/2025	34	5	2	9	1	17	0	0	0	0	0	0	0
Totale													1.082

RE.PUBLIC@POLIMI pubblicazioni di ricerca del Politecnico di Milano