Different definitions can be found for professional ethics. An attractive one, often defined in many codes of ethics, states that, when practicing a profession, an individual must refer to the state-of-the-art knowledge, and should not disregard any of the pieces of information that it provides him or her. There are however important professions, such as forensic metrology, that are across two very different disciplines, and refer to principles that may appear as conflicting. This paper discusses them briefly and proves, also referring to real cases, that favoring one instead of the other may result in a violation of professional ethics. On the contrary, the correct and complete exploitation of the available evidence is not only ethical, but helps justice accomplish its mission.

Forensic metrology: when measurement science meets ethics2014 IEEE International Symposium on Ethics in Science, Technology and Engineering

FERRERO, ALESSANDRO;SCOTTI, VERONICA
2014-01-01

Abstract

Different definitions can be found for professional ethics. An attractive one, often defined in many codes of ethics, states that, when practicing a profession, an individual must refer to the state-of-the-art knowledge, and should not disregard any of the pieces of information that it provides him or her. There are however important professions, such as forensic metrology, that are across two very different disciplines, and refer to principles that may appear as conflicting. This paper discusses them briefly and proves, also referring to real cases, that favoring one instead of the other may result in a violation of professional ethics. On the contrary, the correct and complete exploitation of the available evidence is not only ethical, but helps justice accomplish its mission.
2014
2014 IEEE International Symposium on Ethics in Science, Technology and Engineering
9781479949922
Ethics; Measurement; Forensic metrology
File in questo prodotto:
File Dimensione Formato  
ieee_ethics2014.pdf

Accesso riservato

: Post-Print (DRAFT o Author’s Accepted Manuscript-AAM)
Dimensione 103.83 kB
Formato Adobe PDF
103.83 kB Adobe PDF   Visualizza/Apri

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11311/861351
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 2
  • ???jsp.display-item.citation.isi??? 0
social impact