This paper proposes a synthesis methodology aimed at improving the concurrent error property of combinational TSC devices. The methodology is based on an iterative application of a structural modification of the device (observability modification) and an evaluation of the impact of such a modification. The quality evaluation is performed by means of a cost function for totally self-checking combinational devices which takes into account different aspects besides the area overhead criterion for comparing different realization strategies. The methodology has been validated on a set of MCNC91 benchmarks.

A synthesis methodology aimed at improving the quality of TSC devices

BOLCHINI, CRISTIANA;SALICE, FABIO;SCIUTO, DONATELLA
1999-01-01

Abstract

This paper proposes a synthesis methodology aimed at improving the concurrent error property of combinational TSC devices. The methodology is based on an iterative application of a structural modification of the device (observability modification) and an evaluation of the impact of such a modification. The quality evaluation is performed by means of a cost function for totally self-checking combinational devices which takes into account different aspects besides the area overhead criterion for comparing different realization strategies. The methodology has been validated on a set of MCNC91 benchmarks.
1999
Proc. IEEE Int. Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'99)
076950325X
File in questo prodotto:
File Dimensione Formato  
00802891.pdf

Accesso riservato

: Post-Print (DRAFT o Author’s Accepted Manuscript-AAM)
Dimensione 259.21 kB
Formato Adobe PDF
259.21 kB Adobe PDF   Visualizza/Apri

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11311/654976
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 2
  • ???jsp.display-item.citation.isi??? ND
social impact