This paper proposes a scalar cost function for analyzing the quality of Totally Self-Checking combinational devices; in particular the presented evaluator allows one to take into account other significant aspects affecting a TSC implementation rather than area overhead. The cost function is based on a measure which dynamically defines the probability to achieve the TSC goal at cycle t with respect to fault occurrence and circuit stimulation. As some experimental results highlight, the smallest circuits aren't always the most desirable one.
A scalar cost function for analyzing the quality of totally self-checking design methodologies
BOLCHINI, CRISTIANA;SALICE, FABIO;SCIUTO, DONATELLA
1997-01-01
Abstract
This paper proposes a scalar cost function for analyzing the quality of Totally Self-Checking combinational devices; in particular the presented evaluator allows one to take into account other significant aspects affecting a TSC implementation rather than area overhead. The cost function is based on a measure which dynamically defines the probability to achieve the TSC goal at cycle t with respect to fault occurrence and circuit stimulation. As some experimental results highlight, the smallest circuits aren't always the most desirable one.File in questo prodotto:
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