Aim of this paper is the analysis of different functional fault models for multi-level implementations of sequential circuits. The relationships between functional and gate level fault coverage are fully discussed.
FSM fault models impact on test performances
BOLCHINI, CRISTIANA;
1993-01-01
Abstract
Aim of this paper is the analysis of different functional fault models for multi-level implementations of sequential circuits. The relationships between functional and gate level fault coverage are fully discussed.File in questo prodotto:
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