This paper proposes a methodology for designing FPGAs able to self-detect the occurrence of hardware failures, integrated in a standard, industrial design flow. The approach improves the results proposed in the past, by defining a testing environment which takes into account the peculiarities of FPGA platforms.

An Integrated Approach for Designing Self-Checking FPGAs

BOLCHINI, CRISTIANA;SALICE, FABIO;SCIUTO, DONATELLA;
2003-01-01

Abstract

This paper proposes a methodology for designing FPGAs able to self-detect the occurrence of hardware failures, integrated in a standard, industrial design flow. The approach improves the results proposed in the past, by defining a testing environment which takes into account the peculiarities of FPGA platforms.
2003
Proc. IEEE Int. Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2003
0769520421
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11311/264507
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