Dynamic Reliability Management (DRM) is an attractive system-level approach to mitigate the effects of aging and degradation phenomena in systems equipped with multiple computing resources, trading performance to improve lifetime reliability and/or power efficiency. In this paper, we propose a novel DRM controller for Heterogeneous System Architectures running on the top of Linux Operating System able to dynamically adapt to the system conditions and workload characteristics, leveraging on the applications' performance, power consumption and system lifetime. Based on the user's goal, the framework can be exploited to implement DRM policies optimizing the desired trade-off between the identified metrics. The implementation of the controller on the Samsung Exynos 5 architecture is reported together with the evaluation of a state-of-the-art mapping policy here enhanced to be reliability-aware.

A dynamic reliability management framework for heterogeneous multicore systems

BALDASSARI, ALESSANDRO;Bolchini, Cristiana;Miele, Antonio
2017-01-01

Abstract

Dynamic Reliability Management (DRM) is an attractive system-level approach to mitigate the effects of aging and degradation phenomena in systems equipped with multiple computing resources, trading performance to improve lifetime reliability and/or power efficiency. In this paper, we propose a novel DRM controller for Heterogeneous System Architectures running on the top of Linux Operating System able to dynamically adapt to the system conditions and workload characteristics, leveraging on the applications' performance, power consumption and system lifetime. Based on the user's goal, the framework can be exploited to implement DRM policies optimizing the desired trade-off between the identified metrics. The implementation of the controller on the Samsung Exynos 5 architecture is reported together with the evaluation of a state-of-the-art mapping policy here enhanced to be reliability-aware.
2017
Proceedings of IEEE Int. Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017
9781538603628
Hardware and Architecture; Electrical and Electronic Engineering; Safety, Risk, Reliability and Quality
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11311/1063999
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